Abstract:

Recently， China's automotive chip industry has made significant progress， however promoting the application of domestically produced automotive chips in vehicles faces enormous challenges. Taking the core component of the vehicle controller - vehicle grade MCU （microcontroller unit） chip as an example， although traditional ATE testing can simulate the environmental conditions of real vehicle driving to verify the functionality， performance， and reliability of MCU chips， there is a large technical gap in whether the independently developed vehicle specification level MCU chips meet the strict technical requirements of actual vehicles in complex driving conditions and harsh working environment in terms of functionality， performance， and reliability and functional safety， mainly manifested in the lack of vehicle specification level MCU chips matching test methods in China， the lack of relevant testing systems and experimental data statistical analysis methods， and the inability to carry out vehicle specification level MCU chips matching evaluation under real vehicle driving conditions. For the above problems， in this paper a vehicle compatibility testing concept and actual vehicle testing method for automotive grade MCU chips is proposed. The experiments prove that this testing method can achieve 100% coverage testing of the basic functions of typical automotive grade MCU chips. The data sampling synchronization period of the vehicle matching testing equipment system is less than 1 ms， which can cover the data acquisition cycle requirements under typical vehicle operating conditions. In addition， in this paper the stability and consistency of vehicle grade MCU chips vehicle environment testing performance data is also defined. A stability and consistency evaluation index system based on vehicle grade MCU chips vehicle environment testing performance data is established， and a data statistical analysis method is proposed that integrates vehicle testing data preparation， analysis， and evaluation. The coefficient of variation is studied and recommended values are provided， filling the technical gap in vehicle grade MCU chip matching evaluation under real vehicle driving conditions.

Key words: vehicle grade chips, MCU chips, vehicle matching test method, vehicle matching testing system, data statistical analysis methods